Estudio de impurezas en la interfaz de silicio cristalino y oxido de silicio amorfo
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| Format: | Tesis de licenciatura |
| Language: | Español |
| Published: |
1987
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| Online Access: | https://hdl.handle.net/20.500.14330/TES01000045337 http://132.248.9.195/pmig2018/0045337/Index.html |